A new testable design of field programmable logic arrays
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Lower Overhead Design for Testability of Programmable Logic ArraysIEEE Transactions on Computers, 1986
- A Testable PLA Design with Low Overhead and High Fault CoverageIEEE Transactions on Computers, 1984
- An Easily Testable Design of Programmable Logic Arrays for Multiple FaultsIEEE Transactions on Computers, 1983
- A Design of Programmable Logic Arrays with Universal TestsIEEE Transactions on Computers, 1981