An automated optical on-wafer probing system for ultra-high-speed ICs
- 1 January 1992
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 834
- https://doi.org/10.1109/test.1992.527907
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- A picosecond external electro-optic prober using laser diodesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Ultrahigh speed 2 bit MUX and DEMUX ICs using AlGaAs/GaAs L-BCT technologyElectronics Letters, 1992
- Electro-optic sampling using an external GaAs probe tipElectronics Letters, 1990
- Subpicosecond sampling using a noncontact electro-optic probeJournal of Applied Physics, 1989
- Sensitivity of direct electro-optic sampling to adjacent signal linesApplied Physics Letters, 1989
- Picosecond optical sampling of GaAs integrated circuitsIEEE Journal of Quantum Electronics, 1988
- A Non-contact Electro-optic Prober for High Speed Integrated CircuitsPublished by Springer Nature ,1987
- High-speed electrical sampling by fs photoemissionApplied Physics Letters, 1986
- Measurement of real-time digital signals in a silicon bipolar junction transistor using a noninvasive optical probeElectronics Letters, 1986
- Picosecond electro-optic sampling systemApplied Physics Letters, 1982