On Failure Mechanisms in Large-Scale Integrated Circuits

This publication has 62 references indexed in Scilit:

• The metal-semiconductor contact: an old device with a new future
  IEEE Spectrum, 1970
• Interaction of technology and performance in complementary symmetry MOS integrated circuits
  IEEE Journal of Solid-State Circuits, 1970
• A perspective on integrated electronics
  IEEE Spectrum, 1970
• Silicon-gate technology
  IEEE Spectrum, 1969
• Transistor-transistor logic with high packing density and optimum performance at high inverse gain
  IEEE Journal of Solid-State Circuits, 1968
• Metal-nitride-oxide-silicon field-effect transistors, with self-aligned gates
  Solid-State Electronics, 1968
• A metal-insulator-silicon junction seal
  IEEE Transactions on Electron Devices, 1968
• Reliability Physics
  IEEE Transactions on Reliability, 1968
• Current Status of Large Scale Integration Technology
  IEEE Journal of Solid-State Circuits, 1967
• Beam-Lead Technology
  Bell System Technical Journal, 1966