The effectiveness of chromium and TiW as diffusion barriers for AuZn/Au contacts in InP junction field effect transistors
- 1 August 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 162, 161-169
- https://doi.org/10.1016/0040-6090(88)90204-0
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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