The influence of ion-implanted profiles on the performance of GaAs MESFET's and MMIC amplifiers
- 1 April 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 36 (4) , 642-652
- https://doi.org/10.1109/22.3568
Abstract
No abstract availableKeywords
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