Vector space theoretic analysis of additive cellular automata and its application for pseudoexhaustive test pattern generation
- 1 March 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 42 (3) , 340-352
- https://doi.org/10.1109/12.210176
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- On characterization of cellular automata with matrix algebraInformation Sciences, 1992
- Built-in self-test structures around cellular automata and countersIEE Proceedings E Computers and Digital Techniques, 1990
- An efficient on-chip deterministic test pattern generation schemeMicroprocessing and Microprogramming, 1989
- Cellular automata-based pseudorandom number generators for built-in self-testIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- Circuits for pseudoexhaustive test pattern generationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Exhaustive test pattern generation using cyclic codesIEEE Transactions on Computers, 1988
- Condensed Linear Feedback Shift Register (LFSR) Testing—A Pseudoexhaustive Test TechniqueIEEE Transactions on Computers, 1986
- Logic Test Pattern Generation Using Linear CodesIEEE Transactions on Computers, 1984
- Iterative Exhaustive Pattern Generation for Logic TestingIBM Journal of Research and Development, 1984
- Exhaustive Generation of Bit Patterns with Applications to VLSI Self-TestingIEEE Transactions on Computers, 1983