Self-aligned Ti and Co silicides for high performance sub-0.18 μm CMOS technologies
- 1 May 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 320 (1) , 110-121
- https://doi.org/10.1016/s0040-6090(97)01069-9
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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