Infrared ellipsometry—measurement of the optical properties of thin silver and gold films at 1.15, 3.39 and 10 μm
- 30 September 1975
- journal article
- Published by Elsevier in Optics Communications
- Vol. 15 (1) , 115-120
- https://doi.org/10.1016/0030-4018(75)90197-2
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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- Measurement of Epitaxial Film Thickness Using an Infrared EllipsometerJournal of the Electrochemical Society, 1966
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