Overall consideration of scan design and test generation

Abstract

A complete system which takes the test generation algorithm, the scan cell selection strategy and the structure of the scan chain into account is proposed. It is totally different from the traditional approaches which try to enhance the ability of the individual subject. The goal of this research is to reduce the extra costs caused by the scan design, especially the test application time. Experimental results show that the overall consideration of scan design and test generation can speed up test generation and greatly reduce the amount of test application time.

Keywords

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