Power-supply current diagnosis of VLSI circuits
- 1 March 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 43 (1) , 30-38
- https://doi.org/10.1109/24.285105
Abstract
No abstract availableKeywords
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- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test Considerations for Gate Oxide Shorts in CMOS ICsIEEE Design & Test of Computers, 1986
- Supply-current analysis (scan) as a screen for bipolar integrated circuitsElectronics Letters, 1978