Parameter estimation in MOS conductance studies

This publication has 6 references indexed in Scilit:

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  Solid-State Electronics, 1987
• Extraction of interface state attributes from MOS conductance measurements
  Solid-State Electronics, 1987
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  Solid-State Electronics, 1983
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  Solid-State Electronics, 1974
• A method to extract interface state parameters from the MIS parallel conductance technique
  Solid-State Electronics, 1973
• Expedient method of obtaining interface state properties from MIS conductance measurements
  Solid-State Electronics, 1969