Stranski-Krastanov Growth of Ni on Si(111) at Room Temperature

This publication has 16 references indexed in Scilit:

• In-situ transmission electron microscopy of NiSi2 formation by molecular beam epitaxy
  Surface Science, 1989
• NiSi mixing: A new model for low temperature silicide formation
  Surface Science, 1985
• Electronic properties on silicon-transition metal interface compounds
  Surface Science Reports, 1985
• Structure and Nucleation Mechanism of Nickel Silicide on Si(111) Derived from Surface Extended-X-Ray-Absorption Fine Structure
  Physical Review Letters, 1983
• Electronic structure of Ni and Pd alloys. III. Correlation effects in the Auger spectra of Ni alloys
  Physical Review B, 1983
• Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures
  Physical Review Letters, 1983
• Electronic structure of silicide-silicon interfaces
  Thin Solid Films, 1982
• Stoichiometric and Structural Origin of Electronic States at thePd2Si-Si Interface
  Physical Review Letters, 1981
• Application of Auger electron spectroscopy to studies of the silicon/silicide interface
  Journal of Vacuum Science and Technology, 1978
• Relative sensitivity factors for quantitative Auger analysis of binary alloys
  Surface Science, 1977