SILC-related effects in flash E/sup 2/PROM's-Part I: A quantitative model for steady-state SILC
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 45 (8) , 1745-1750
- https://doi.org/10.1109/16.704374
Abstract
No abstract availableKeywords
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