Frontiers of silicon-on-insulator
Top Cited Papers
- 1 May 2003
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 93 (9) , 4955-4978
- https://doi.org/10.1063/1.1558223
Abstract
Silicon-on-insulator (SOI) wafers are precisely engineered multilayer semiconductor/dielectric structures that provide new functionality for advanced Si devices. After more than three decades of materials research and device studies, SOI wafers have entered into the mainstream of semiconductor electronics. SOI technology offers significant advantages in design, fabrication, and performance of many semiconductor circuits. It also improves prospects for extending Si devices into the nanometer region (<10 nm channel length). In this article, we discuss methods of forming SOI wafers, their physical properties, and the latest improvements in controlling the structure parameters. We also describe devices that take advantage of SOI, and consider their electrical characteristics.Keywords
This publication has 70 references indexed in Scilit:
- Channel-width dependence of floating body effects in STI- and LOCOS-isolated MOSFETSMicroelectronic Engineering, 2001
- FinFET-a self-aligned double-gate MOSFET scalable to 20 nmIEEE Transactions on Electron Devices, 2000
- Adaptation of the pseudo-MOS transistor for the characterization of silicon-on-sapphire filmsSolid-State Electronics, 2000
- Surface-related phenomena in the direct bonding of silicon and fused-silica wafer pairsPhilips Journal of Research, 1995
- Kinetic model for hydrogen reactions in boron-doped siliconJournal of Applied Physics, 1993
- Influence of series resistances and interface coupling on the transconductance of fully-depleted silicon-on-insulator MOSFETsSolid-State Electronics, 1992
- A 100-V lateral DMOS transistor with a 0.3-micrometer channel in a 1-micrometer silicon-film-on-insulator-on-siliconIEEE Transactions on Electron Devices, 1991
- SOI by CVD: Epitaxial Lateral Overgrowth (ELO) process—ReviewJournal of Crystal Growth, 1983
- Laser crystallization of thin Si films on amorphous insulating substratesJournal of Crystal Growth, 1983
- Double-Cantilever Cleavage Mode of Crack PropagationJournal of Applied Physics, 1964