Test structures for investigation of metal coverage effects on MOSFET matching
- 22 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Influence of die attachment on MOS transistor matchingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- The impact of mechanical stress control on VLSI fabrication processPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On the impact of spatial parametric variations on MOS transistor mismatchPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Effects of metal coverage on MOSFET matchingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Design of matching test structures [IC components]Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Effects of stress-induced mismatches on CMOS analog circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On the relationship between topography and transistor matching in an analog CMOS technologyIEEE Transactions on Electron Devices, 1992
- A 10-b 40-MHz 0.8- mu m CMOS current-output D/A converterIEEE Journal of Solid-State Circuits, 1991
- Matching properties of MOS transistorsIEEE Journal of Solid-State Circuits, 1989
- Characterisation and modeling of mismatch in MOS transistors for precision analog designIEEE Journal of Solid-State Circuits, 1986