Depth profiling of InxGa1-xAs/GaAs superlattice
- 1 September 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 72 (1) , 89-93
- https://doi.org/10.1016/0169-4332(93)90047-f
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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