NCUBE: an automatic test generation program for iterative logic arrays

Publisher Website

6 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iccad.1988.122542

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling
Journal of Electronic Testing, 1991
The Design of Easily Testable VLSI Array Multipliers
IEEE Transactions on Computers, 1984
A Testable Design of Iterative Logic Arrays
IEEE Transactions on Computers, 1981
Truth-Table Verification of an Iterative Logic Array
IEEE Transactions on Computers, 1976
Tessellation Aspect of Combinational Cellular Array Testing
IEEE Transactions on Computers, 1974
Easily Testable Iterative Systems
IEEE Transactions on Computers, 1973
Fault Detection in Iterative Logic Arrays
IEEE Transactions on Computers, 1971
Testing for faults in combinational cellular logic arrays
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1967