Amorphous and microcrystalline silicon films deposited by hot-wire chemical vapor deposition at filament temperatures between 1500 and 1900 °C
- 1 June 1996
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 79 (11) , 8748-8760
- https://doi.org/10.1063/1.362501
Abstract
No abstract availableThis publication has 41 references indexed in Scilit:
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