Mosfet Modeling for Circuit Simulation
- 1 January 1989
- book chapter
- Published by Elsevier
Abstract
No abstract availableKeywords
This publication has 92 references indexed in Scilit:
- An accurate and analytic threshold-voltage model for small-geometry MOSFETs with single-channel ion implantation in VLSISolid-State Electronics, 1985
- An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devicesSolid-State Electronics, 1984
- Drain-voltage effects on the threshold voltage of a small-geometry MOSFETSolid-State Electronics, 1983
- Analytical solutions for threshold voltage calculations in ion-implanted IGFETsSolid-State Electronics, 1983
- Simplified long-channel MOSFET theorySolid-State Electronics, 1983
- Charge accumulation and mobility in thin dielectric MOS transistorsSolid-State Electronics, 1982
- Accurate two sections model for MOS transistor in saturationSolid-State Electronics, 1976
- MOS threshold shifting by ion implantationSolid-State Electronics, 1973
- Threshold voltage of nonuniformly doped MOS structuresSolid-State Electronics, 1973
- Threshold shift calculations for ion implanted MOS devicesSolid-State Electronics, 1972