Minimizing production test time to detect faults in analog circuits
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 13 (6) , 796-813
- https://doi.org/10.1109/43.285252
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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