The test of time. Clock-cycle estimation and test challenges for future microprocessors
- 1 March 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Circuits and Devices Magazine
- Vol. 14 (2) , 37-44
- https://doi.org/10.1109/101.666590
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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