The impact of MOSFET technology evolution and scaling on electrostatic discharge protection
- 1 November 1998
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 38 (11) , 1649-1668
- https://doi.org/10.1016/s0026-2714(98)00169-3
Abstract
No abstract availableThis publication has 59 references indexed in Scilit:
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