On the characterization of surface states and deep traps in GaAs MESFETs
- 31 December 1993
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 36 (12) , 1665-1672
- https://doi.org/10.1016/0038-1101(93)90211-8
Abstract
No abstract availableKeywords
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