Using BIST control for pattern generation
- 23 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 347-355
- https://doi.org/10.1109/test.1997.639636
Abstract
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It takes advantage of the fact that any autonomous BIST scheme needs a BIST control unit for indicating the completion of the self-test at least. Hence, pattern counters and bit counters are always available, and they provide information to be used for deterministic pattern generation by some additional circuitry. This paper presents a systematic way for synthesizing a pattern generator which needs less area than a 32-bit LFSR for random pattern generation for all the benchmark circuits.Keywords
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