Cation and anion vacancies in proton irradiated GaInP
- 31 October 2002
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 92 (10) , 5942-5949
- https://doi.org/10.1063/1.1515123
Abstract
Defects in electron irradiated GaInP grown by molecular beam epitaxy have been investigated using deep level transient spectroscopy (DLTS) and positron annihilation spectroscopy (PAS). PAS measurements indicate that vacancies are introduced at a high rate. Core annihilation curves, compared with theoretical calculations, are used to identify the principal defect in n-GaInP as cation vacancies, while phosphorus vacancies are seen in both undoped and n-type GaInP. The concentrations of defects obtained by PAS and Hall are in good agreement with each other. DLTS gives much lower values, possibly due to assumptions in the C–V analysis. These results give support to the identification of the midgap deep level observed using DLTS in irradiated and as-grown n-type and undoped GaInP as the phosphorus vacancy.This publication has 29 references indexed in Scilit:
- Recombination enhanced defect reactions in 1 MeV electron irradiated p InGaPJournal of Applied Physics, 2001
- Influence of deep level impurities on modulation response of InGaP light emitting diodesJournal of Applied Physics, 2001
- Annealing of the deep recombination center in GaInP/AlGaInP quantum wells grown by solid-source molecular beam epitaxyJournal of Applied Physics, 1999
- Spatial distribution of radiation-induced defects in p+-n InGaP solar cellsApplied Physics Letters, 1999
- Minority-carrier injection-enhanced annealing of radiation damage to InGaP solar cellsApplied Physics Letters, 1997
- Characteristics of electron traps in In0.5Ga0.5P generated by recombination enhanced defect reactionsApplied Physics Letters, 1993
- Defects in electron irradiated GaInPJournal of Applied Physics, 1993
- Behaviour of anion vacancy in InxGa1-xAsyP1-y grown on (111)A and (100) GaAsJournal of Crystal Growth, 1990
- Main Electron Traps in In1-xGaxP (0.12≤ x ≤ 0.96)Japanese Journal of Applied Physics, 1989
- Electron Paramagnetic Resonance of Intrinsic Defects in III-V SemiconductorsMRS Proceedings, 1985