Dynamic test compaction for synchronous sequential circuits using static compaction techniques
- 23 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- On static compaction of test sequences for synchronous sequential circuitsPublished by Association for Computing Machinery (ACM) ,1996
- COMPACTEST: a method to generate compact test sets for combinational circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1993