InGaAsP superlattices grown by liquid-phase epitaxy

Abstract
The liquid-phase epitaxy of InGaAsP periodic structures is reported. A conventional horizontal sliding boat or a computer-controlled rotating crucible was used to grow two types of structures. Stacks of thin layers grown from the same melt showed high-quality x-ray diffraction profiles, which are shown to allow a precise determination of layer thickness; supersaturation was found to significantly influence layer thickness for short growth times. In superlattices such as InP/InGaAsP or InGaAsP/InGaAs, good composition and thickness reproductibility throughout the structure was verified by Auger sputtering. The presence of satellite peaks in x-ray diffraction profiles clearly proved that periodicity was well achieved in these structures. Quantum effects were observed by photoluminescence in sufficiently small wells.