Deep-level transient spectroscopy of Al/sub x/Ga/sub 1-x/As/GaAs using nondestructive acousto-electric voltage measurement
- 1 June 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 36 (6) , 1189-1195
- https://doi.org/10.1109/16.24367
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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