Response of interface traps during high-temperature anneals (MOSFETs)
- 1 December 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 38 (6) , 1590-1597
- https://doi.org/10.1109/23.124150
Abstract
No abstract availableThis publication has 32 references indexed in Scilit:
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