Design of static CMOS self-checking circuits using built-in current sensing
- 1 January 1992
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 104-111
- https://doi.org/10.1109/ftcs.1992.243610
Abstract
ISBN: 0818628707The authors present a novel scheme to implement self-checking circuits in static CMOS. A strongly code disjoint (SCD) built-in current sensor (BICS) is presented and is used to cover faults whose detection cannot be guaranteed by logic monitoring. A previously fabricated and tested high-speed BICS is examined in this paper for its behavior in the presence of faults. Then, a self-exercising mechanism is designed to obtain the SCD property. The integration of this SCD BICS with self-checking circuit achieves the well-known totally self-checking (TSC) goal. The low-cost and high fault coverage are attractive for many high reliability and critical applicationsKeywords
This publication has 16 references indexed in Scilit:
- Testing for parametric faults in static CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An SFS Berger check prediction ALU and its application to self-checking processor designsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1992
- Shorts in self-checking circuitsJournal of Electronic Testing, 1991
- Strong fault-secure and strongly self-checking domino-CMOS implementations of totally self-checking circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- A self-testing ALU using built-in current sensingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- Designing CMOS Circuits for Switch-Level TestabilityIEEE Design & Test of Computers, 1987
- Inductive Fault Analysis of MOS Integrated CircuitsIEEE Design & Test of Computers, 1985
- Strongly Fault Secure Logic NetworksIEEE Transactions on Computers, 1978
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978
- Design of Totally Self-Checking Check Circuits for m-Out-of-n CodesIEEE Transactions on Computers, 1973