A new class of fault models and test algorithms for dual-port dynamic RAM testing
- 31 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model Author(s) Alves, V.C. TIMA INPG, Grenoble, France Kebichi, O. ; Ferreira, A.Keywords
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