Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays
- 1 June 1999
- journal article
- Published by Elsevier in Journal of Magnetism and Magnetic Materials
- Vol. 198-199, 653-655
- https://doi.org/10.1016/s0304-8853(98)01176-7
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Evidence of roughness distributions and interface smoothing in Co/Cu multilayers deposited under energetic particle bombardmentJournal of Physics D: Applied Physics, 1998
- High resolution reflectivity diffractometer on Station 2.3 (Daresbury Laboratory)Review of Scientific Instruments, 1998
- X-ray and neutron reflectivity analysis of thin films and superlatticesApplied Physics A, 1994
- Oscillatory magnetic exchange coupling through thin copper layersPhysical Review Letters, 1991
- Measurement of stress in nickel oxide layers by diffraction of synchrotron radiationJournal of Materials Science, 1991
- I n s i t u measurement of stress in Co/Cu, Co/Pd, and Co/Au compositionally modulated multilayer filmsJournal of Applied Physics, 1990
- A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback systemJournal of Applied Crystallography, 1990
- Anomalous X-ray scattering study of composition profile in Fe/Mn superlattice filmsJournal of Physics F: Metal Physics, 1988
- The accuracy of stress measurement using the X-ray diffraction methodJournal of Applied Crystallography, 1986