A serially addressable, flexible current monitor for test fixture based I/sub DDQ//I/sub SSQ/ testing
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- A general purpose I/sub DDQ/ measurement circuitPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Development of a class 1 QTAG monitorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- QTAG: a standard for test fixture based I/sub DDQ//I/sub SSQ/ monitorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Empirical failure analysis and validation of fault models in CMOS VLSIPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- I DDQ testing in CMOS digital ASICsJournal of Electronic Testing, 1992
- Assessing Fault Model and Test QualityPublished by Springer Nature ,1992
- Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need?Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992
- IC quality and test transparencyIEEE Transactions on Industrial Electronics, 1989
- Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their TestabilityIEEE Transactions on Computers, 1980
- Fault Coverage in Digital Integrated CircuitsBell System Technical Journal, 1978