QTAG: a standard for test fixture based I/sub DDQ//I/sub SSQ/ monitors
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 194-202
- https://doi.org/10.1109/test.1994.527950
Abstract
This paper describes the goals and history of the Quality Test Action Group (QTAG) since if was formed at the 1993 International Test Conference. QTAG was created to provide the industry with a de-facto standard for I/sub DDQ//I/sub SSQ/ monitors on test fixtures for production testing of CMOS ICs. The group was needed because informal discussions between the semiconductor test departments and the ATE vendors over the past decade had failed to generate the ATE based I/sub DDQ/ test instrumentation needed by the semiconductor industry.Keywords
This publication has 12 references indexed in Scilit:
- Reliability testing by precise electrical measurementPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A general purpose I/sub DDQ/ measurement circuitPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A serially addressable, flexible current monitor for test fixture based I/sub DDQ//I/sub SSQ/ testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An off-chip IDDq current measurement unit for telecommunication ASICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Development of a class 1 QTAG monitorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Reducing the CMOS RAM test complexity withI DDQ and voltage testingJournal of Electronic Testing, 1995
- IDDQ Testing of VLSI CircuitsPublished by Springer Nature ,1993
- I DDQ testing as a component of a test suite: The need for several fault coverage metricsJournal of Electronic Testing, 1992
- Test Considerations for Gate Oxide Shorts in CMOS ICsIEEE Design & Test of Computers, 1986