Development of a class 1 QTAG monitor
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 213-222
- https://doi.org/10.1109/test.1994.527952
Abstract
This paper describes the development by the authors of an I/sub DDQ/ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips' support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip I/sub DDQ/ monitors or ATE based measurement systems.Keywords
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