DFT advances in the Motorola's MPC7400, a PowerPC/sup TM/ G4 microprocessor
- 20 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Functional comparison of logic designs for VLSI circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Balancing structured and ad-hoc design for test: testing of the PowerPC 603 microprocessorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Designing for scan test of high performance embedded memoriesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- How seriously do you take possible-detect faults?Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A case study of the test development for the 2nd generation ColdFire/sup R/ microprocessorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Next generation PowerPC/sup TM/ microprocessor test strategy improvementsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Integrated diagnostics for embedded memory built-in self test on PowerPC/sup TM/ devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Test strategy for the PowerPC 750 microprocessorIEEE Design & Test of Computers, 1998
- Testability features of the AMD-K6 microprocessorIEEE Design & Test of Computers, 1998
- Logic design verification via test generationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988