Thick target X-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of pottery
- 1 April 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 15 (1) , 612-615
- https://doi.org/10.1016/0168-583x(86)90377-0
Abstract
No abstract availableKeywords
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