X-Ray diffraction investigations of magnetron sputtered TiCN coatings
- 1 September 1995
- journal article
- Published by Elsevier in Surface and Coatings Technology
- Vol. 74-75, 312-319
- https://doi.org/10.1016/0257-8972(95)08238-7
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Wear resistant composite coatings deposited by electron enhanced closed field unbalanced magnetron sputteringSurface and Coatings Technology, 1995
- Lattice constant determination by grazing incidence diffraction in thin cubic films under thermal strainThin Solid Films, 1995
- Anomalies in the lattice parameters and residual stress of coatings made by physical vapor deposition methodsSurface and Coatings Technology, 1990
- The residual stress in TiN films deposited onto cemented carbide by high-rate reactive sputteringSurface and Coatings Technology, 1989
- Residual stress in physically vapor deposited films: A study of deviations from elastic behaviorThin Solid Films, 1989
- X-ray diffraction studies of physically vapour-deposited coatingsSurface and Coatings Technology, 1989
- Detailed X-ray diffraction study of titanium nitride coatings: Some interpretation problemsMaterials Science and Engineering: A, 1988
- Correlation of process and system parameters with structure and properties of physically vapour- deposited hard coatingsThin Solid Films, 1988
- Structure and properties of TiN coatingsThin Solid Films, 1985
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948