SIMOX devices and circuits

This publication has 13 references indexed in Scilit:

• The multi-stable behaviour of SOI-NMOS transistors at low temperatures
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• The reduction of dislocations in oxygen implanted silicon-on-insulator layers by sequential implantation and annealing
  Journal of Applied Physics, 1988
• Reduction of kink effect in thin-film SOI MOSFETs
  IEEE Electron Device Letters, 1988
• Hot-electron effects in Silicon-on-insulator n-channel MOSFET's
  IEEE Transactions on Electron Devices, 1987
• The effects of oxygen dose on the formation of buried oxide silicon-on-insulator
  Journal of Applied Physics, 1987
• IIB-1 1.25-µm buried-oxide SOI/CMOS process for 16K/64K SRAMS
  IEEE Transactions on Electron Devices, 1986
• Improved subthreshold characteristics of n-channel SOI transistors
  IEEE Electron Device Letters, 1986
• Subthreshold slope of thin-film SOI MOSFET's
  IEEE Electron Device Letters, 1986
• Reduction of floating substrate effect in thin-film SOI MOSFETs
  Electronics Letters, 1986
• Microstructure of silicon implanted with high dose oxygen ions
  Applied Physics Letters, 1985