A RHEED study of the transition from two-dimensional to three-dimensional growth in the InAs/GaAs system
- 1 October 1997
- journal article
- Published by Pleiades Publishing Ltd in Semiconductors
- Vol. 31 (10) , 1057-1059
- https://doi.org/10.1134/1.1187025
Abstract
A specially developed detection system and an analysis of RHEED diffraction patterns were used to investigate the dynamics of transition from two-dimensional to three-dimensional growth mechanism in tKeywords
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