Defect level evaluation in an IC design environment
Open Access
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 15 (10) , 1286-1293
- https://doi.org/10.1109/43.541448
Abstract
No abstract availableKeywords
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