Flash Memory Reliability

This publication has 14 references indexed in Scilit:

• Degradation mechanism of flash EEPROM programming after program/erase cycles
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Failure mechanisms of flash cell in program/erase cycling
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• The solution of over-erase problem controlling poly-Si grain size-modified scaling principles for flash memory
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A self-convergence erasing scheme for a simple stacked gate flash EEPROM
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A convergence scheme for over-erased flash EEPROM's using substrate-bias-enhanced hot electron injection
  IEEE Electron Device Letters, 1995
• Flash EPROM disturb mechanisms
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1994
• Erratic Erase In ETOX/sup TM/ Flash Memory Array
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1993
• Floating gate memories reliability
  Quality and Reliability Engineering International, 1992
• Stress-induced current in thin silicon dioxide films
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992
• Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime
  Journal of Applied Physics, 1983