NiTi shape memory alloy thin films: composition control using optical emission spectroscopy
- 1 September 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 283 (1-2) , 61-66
- https://doi.org/10.1016/0040-6090(95)08254-9
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Oriented nickel-titanium shape memory alloy films prepared by annealing during depositionApplied Physics Letters, 1992
- NiTi WIRES FOR ORTHODONTIC APPLICATIONJournal de Physique IV, 1991
- ASSESSMENT OF THE DURATION OF TIME REQUIRED FOR CONVENTIONAL Ti-Ni SINTERINGJournal de Physique IV, 1991
- COMPARATIVE STUDY OF MECHANICAL PROPERTIES OF VARIOUS Ni-Ti BASED SHAPE MEMORY ALLOYS IN VIEW OF DENTAL AND MEDICAL APPLICATIONSJournal de Physique IV, 1991
- Vacuum-deposited TiNi shape memory film: characterization and applications in microdevicesJournal of Micromechanics and Microengineering, 1991
- Chamber material effects on actinometric measurements in rf glow dischargesJournal of Applied Physics, 1991
- Shape-memory properties in Ni-Ti sputter-deposited filmJournal of Applied Physics, 1990
- Practical Langmuir probe measurements in deposition plasmasJournal of Vacuum Science & Technology A, 1987
- Analysis of a reactive sputter ion plating discharge for TiN deposition using optical emission spectroscopyThin Solid Films, 1985
- Optical emission spectroscopy of reactive plasmas: A method for correlating emission intensities to reactive particle densityJournal of Applied Physics, 1980