Composition dependence of Au/InxAl1−xAs Schottky barrier heights

Abstract
The surface barrier heights φbn and room‐temperature band gaps Eg of Si‐doped InxAl1−xAs layers grown by molecular beam epitaxy on n‐type (100) oriented InP substrates have been determined as a function of composition with capacitance versus voltage, internal photoemission, photoluminescence, and double‐crystal x‐ray rocking curve measurements for 0.45<x0.78, n‐type surfaces might be accumulated and p‐type surfaces are likely to be inverted.