Development of current-based microscopic defect analysis methods and associated optical filling techniques for the investigation on highly irradiated high resistivity silicon detectors
- 1 September 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 364 (1) , 108-117
- https://doi.org/10.1016/0168-9002(95)00437-8
Abstract
No abstract availableKeywords
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