High energy P implants in silicon
- 1 January 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 62 (3) , 331-337
- https://doi.org/10.1016/0168-583x(92)95252-m
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Channeling implantation of B and P in siliconNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- The EXTRION 220 parallel scan magnetNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Residual defects in high-energy B-, P- and As-implanted Si by rapid thermal annealingApplied Physics A, 1989
- Damage formation and annealing of high energy ion implantation in SiNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- Buried dopant and defect layers for device structures with high-energy ion implantationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- Range distributions of MeV implants in silicon IINuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Profile studies of MeV ions implanted into SiNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- MeV-energy B+, P+ and As+ ion implantation into SiNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- High energy implantation and annealing of phosphorus in siliconNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Range distributions of MeV implants in siliconNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985