Incorporation of dopants into epitaxial CVD‐Silicon layers and incorporation equilibrium
- 1 January 1982
- journal article
- Published by Wiley in Crystal Research and Technology
- Vol. 17 (11) , 1379-1387
- https://doi.org/10.1002/crat.2170171109
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Strength and microstructures of Benzoic Acid‐Benzamide systemCrystal Research and Technology, 1982
- Temperature dependence of doping element incorporation with the chemical vapour deposition of epitaxial silicon (IV). Incorporation of phosphorus in the Si‐H‐Cl‐lP systemCrystal Research and Technology, 1980
- Si / SiO2 Interface Oxidation Kinetics: A Physical Model for the Influence of High Substrate Doping Levels: I . TheoryJournal of the Electrochemical Society, 1979
- Dependence of doping element incorporation on temperature in the chemical vapour deposition of epitaxial silicon (III). Empirical incorporation characteristic of the Si‐P‐H systemCrystal Research and Technology, 1979
- Die Temperaturabhängigkeit des Dotanteneinbaus bei der Abscheidung von Siliziumepitaxieschichten aus der Gasphase (II). Der Phosphoreinbau und die Größe der differentiellen molaren LösungsenthalpieCrystal Research and Technology, 1978
- Die Temperaturabhängigkeit des Dotanteneinbaus bei der Abscheidung von Siliziumepitaxieschichten aus der Gasphase (I) Der Phosphoreinbau und die Natur des SegregationskoeffizientenCrystal Research and Technology, 1978
- The dopant density and temperature dependence of electron mobility and resistivity in n-type siliconSolid-State Electronics, 1977
- The Incorporation of Phosphorus in Silicon Epitaxial Layer GrowthJournal of the Electrochemical Society, 1974
- Doping in chemically vapour deposited epitaxial siliconJournal of Crystal Growth, 1972
- Doping of epitaxial siliconJournal of Crystal Growth, 1970