A Markov chain-based yield formula for VLSI fault-tolerant chips
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 10 (2) , 252-259
- https://doi.org/10.1109/43.68412
Abstract
No abstract availableKeywords
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