Critical Ge concentration for 2×n reconstruction appearing on GeSi covered Si(100)
- 31 May 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 406 (1-3) , L592-L596
- https://doi.org/10.1016/s0039-6028(98)00234-9
Abstract
No abstract availableKeywords
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