Internal chip ESD phenomena beyond the protection circuit
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- NMOS protection circuitryIEEE Transactions on Electron Devices, 1985
- ESD on CHMOS Devices - Equivalent Circuits, Physical Models and Failure Mechanisms8th Reliability Physics Symposium, 1985